Characterization of high-speed optoelectronics devices based optical and electrical spectra analyses - art. no. 68380Q

SEMI OpenIR > 中国科学院半导体研究所（2009年前）

	Characterization of high-speed optoelectronics devices based optical and electrical spectra analyses - art. no. 68380Q
	Wen, JM; Zhu, NH; Zhang, T; Zhu, NH, Chinese Acad Sci, Inst Semicond, State Key Lab Integrated Optoelect, POB 912, Beijing 100083, Peoples R China.
	2008
会议名称	2nd Conference on Optoelectronic Devices and Integration
会议录名称	OPTOELECTRONIC DEVICES AND INTEGRATION II
页码	6838: Q8380-Q8380
会议日期	NOV 12-15, 2007
会议地点	Beijing, PEOPLES R CHINA
出版地	1000 20TH ST, PO BOX 10, BELLINGHAM, WA 98227-0010 USA
出版者	SPIE-INT SOC OPTICAL ENGINEERING
ISSN	0277-786X
ISBN	978-0-8194-7013-3
部门归属	[wen, ji min; zhu, ning hua; zhang, tao] chinese acad sci, inst semicond, state key lab integrated optoelect, beijing 100083, peoples r china
摘要	In this paper, we presents the characterization technique of high-speed optoelectronics devices based electrical and optical spectra, which is as important access to the devices performance as the prevalent vector network analyzer (VNA) sweeping method. The measurement of additional modulation of laser and frequency response of photodetector from electrical spectra, and the estimation of the modulation indexes and the chirp parameters of directly modulated lasers based on optical spectra analysis, are given as examples.
关键词	Frequency Response Additional Modulation Modulation Index Chirp Parameters Optical And Electrical Spectra Analyses
学科领域	光电子学
主办者	SPIE.; Chinese Opt Soc.
收录类别	CPCI-S
语种	英语
文献类型	会议论文
条目标识符	http://ir.semi.ac.cn/handle/172111/7800
专题	中国科学院半导体研究所（2009年前）
通讯作者	Zhu, NH, Chinese Acad Sci, Inst Semicond, State Key Lab Integrated Optoelect, POB 912, Beijing 100083, Peoples R China.
推荐引用方式 GB/T 7714	Wen, JM,Zhu, NH,Zhang, T,et al. Characterization of high-speed optoelectronics devices based optical and electrical spectra analyses - art. no. 68380Q[C]. 1000 20TH ST, PO BOX 10, BELLINGHAM, WA 98227-0010 USA:SPIE-INT SOC OPTICAL ENGINEERING,2008:6838: Q8380-Q8380.

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